Depth profiling of deuterium implanted into stainless steel at room temperature
- 1 March 1978
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 149 (1-3), 59-63
- https://doi.org/10.1016/0029-554x(78)90838-8
Abstract
No abstract availableKeywords
This publication has 22 references indexed in Scilit:
- Computer studies of the scattering of low energy hydrogen ions from polycrystalline solidsJournal of Nuclear Materials, 1976
- Reflection of hydrogen from stainless steel and NbJournal of Nuclear Materials, 1976
- Measurements of the erosion of stainless steel, carbon, and SiC by hydrogen bombardment in the energy range of 0.5 – 7.5 keVJournal of Nuclear Materials, 1976
- Trapping of low-energy helium ions in niobiumJournal of Nuclear Materials, 1975
- Resolution enhancement of the 3He(d,p)4He resonance for profiling helium in solidsJournal of Nuclear Materials, 1974
- Fluxes of charged and neutral particles from tokamaksJournal of Nuclear Materials, 1974
- Depth distribution profiling of deuterium and 3HeJournal of Nuclear Materials, 1974
- First-wall erosion in fusion reactorsNuclear Fusion, 1972
- Trapping and re-emission of fast deuterium ions from nickelJournal of Physics D: Applied Physics, 1969
- Cross Sections for the Reactions , , , and below 120 kevPhysical Review B, 1954