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Noise in junction- and MOS-FET's at high temperatures
Home
Publications
Noise in junction- and MOS-FET's at high temperatures
Noise in junction- and MOS-FET's at high temperatures
AZ
A. van der Ziel
A. van der Ziel
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30 November 1969
journal article
Published by
Elsevier
in
Solid-State Electronics
Vol. 12
(11)
,
861-866
https://doi.org/10.1016/0038-1101(69)90043-4
Abstract
No abstract available
Keywords
MOS FET
NOISE
COURANT
DRAIN
SUBSTRAT
LECKSTROM ZUR
STEUERELECKTRODE EINES
Cited by 13 articles