Nanosecond Breakdown in Liquid Dielectrics

Abstract

Measurements of nanosecond formative times in various liquids are summarized. The experiments utilized applied fields of up to 3.3×10⁶ V/cm while equipment time resolution was on the order of 0.3 nsec. Detailed results are given for n‐hexane including aging time histories and formative times with and without an applied bias field. The data obtained in this study are compared with earlier work. Using a simplified breakdown model the mobility of charge carriers at 2×10⁶ V/cm is calculated to be 8.7×10⁻² cm²/V·sec. The nanosecond high‐voltage insulating qualities of various liquids are discussed.