Interference-Free Determination of the Absorption Coefficient of Amorphous Silicon Thin Films
- 1 March 1992
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 31 (3R)
- https://doi.org/10.1143/jjap.31.768
Abstract
Hishikawa et al. [Jpn. J. Appl. Phys. 30 (1991) 1008] recently used transmission (T) and reflection (R) measurements on amorphous silicon films to show that interference-free absorption spectra (α) can be obtained by self-consistently solving T/(1-R). We show that if R is measured with the sample illuminated from the substrate-side T and R can be converted to T f and R f, the transmission and reflection of a film on a semi-infinite substrate. For weakly absorbing films this simplifies the data analysis considerably as α can be obtained from T f/(1-R f) without any iterative procedures.Keywords
This publication has 4 references indexed in Scilit:
- Interference-Free Determination of the Optical Absorption Coefficient and the Optical Gap of Amorphous Silicon Thin FilmsJapanese Journal of Applied Physics, 1991
- Density of the gap states in undoped and doped glow discharge a-Si:HSolar Energy Materials, 1983
- Photothermal deflection spectroscopy and detectionApplied Optics, 1981
- Optical reflection and transmission formulae for thin filmsJournal of Physics D: Applied Physics, 1968