The analysis of tiiin films by SSMS - A more detailed discharge model and recent experiments
- 31 January 1980
- journal article
- Published by Elsevier in International Journal of Mass Spectrometry and Ion Physics
- Vol. 32 (4), 345-361
- https://doi.org/10.1016/0020-7381(80)80018-0
Abstract
No abstract availableThis publication has 16 references indexed in Scilit:
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