Timing analysis and delay-fault test generation using path-recursive functions
- 10 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Efficient generation of test patterns using Boolean differencePublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Advanced automatic test pattern generation techniques for path delay faultsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Timing analysis using functional analysisIEEE Transactions on Computers, 1988