Preparation of contamination-free tungsten specimens for the field-ion microscope
- 1 December 1967
- journal article
- Published by IOP Publishing in Journal of Scientific Instruments
- Vol. 44 (12), 1044-1045
- https://doi.org/10.1088/0950-7671/44/12/428
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Electron microscope holders for viewing thin wire specimens and field-ion microscope tipsJournal of Scientific Instruments, 1967
- RANGE OF Xe133 AND Ar41 IONS OF KEV ENERGIES IN TUNGSTENCanadian Journal of Physics, 1963