A process for detecting defects in complicated patterns
- 31 December 1973
- journal article
- Published by Elsevier in Computer Graphics and Image Processing
- Vol. 2 (3-4), 326-339
- https://doi.org/10.1016/0146-664x(73)90011-7
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Distance functions on digital picturesPattern Recognition, 1968