Fine Particles of Silicon. II. Decahedral Multiply-Twinned Particles
- 1 March 1987
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 26 (3R), 365-372
- https://doi.org/10.1143/jjap.26.365
Abstract
Decahedral multiply-twinned particles of Si, 60–80 nm in size, prepared by a gas evaporation method are studied by a high resolution electron microscope. A mismatch arising in packing five tetrahedra is accommodated by deforming plastically one of the tetrahedra by introducing a small angle grain boundary. A core region of the particle, however, is deformed elastically. The structural details of the crystalline faults associated with the mismatch are described.Keywords
This publication has 10 references indexed in Scilit:
- Fine Particles of Silicon. I. Crystal Growth of Spherical Particles of SiJapanese Journal of Applied Physics, 1987
- Structural instability of ultrafine particles of metalsPhysical Review Letters, 1986
- Surface structure and energetics of multiply twinned particlesPhilosophical Magazine A, 1984
- Evaluation of the Wiener Spectrum of Radiographic Screen-Film Systems by EntropyJapanese Journal of Applied Physics, 1982
- Combined HREM and STEM microanalysis on decorated dislocation coresUltramicroscopy, 1982
- The structure of small, vapor-deposited particlesJournal of Crystal Growth, 1979
- Crystal structure and habit of silicon and germanium particles grown in argon gasJournal of Crystal Growth, 1979
- Partial disclinationsJournal of Physics C: Solid State Physics, 1972
- Stability of Multiply-Twinned ParticlesJournal of the Physics Society Japan, 1969
- Multiply Twinned Particles at Earlier Stages of Gold Film Formation on Alkalihalide CrystalsJournal of the Physics Society Japan, 1967