Reduced lateral diffusion and reverse leakage in Be-implanted GaAs1−xPxdiodes
- 30 April 1977
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 20 (4), 305-306
- https://doi.org/10.1016/0038-1101(77)90112-5
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- Scanning electron diffraction with energy analysisJournal of Scientific Instruments, 1965