Te-concentration dependence of the emission intensity of CdS:Te by radioactive-tracer profile technique
- 16 October 1971
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 7 (2), K85-K87
- https://doi.org/10.1002/pssa.2210070246
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Luminescence in Tellurium-Doped Cadmium SulfideJournal of Applied Physics, 1970
- The origin of the 2.0 eV emissions in pure and doped cadmium sulphideJournal of Luminescence, 1970
- Optical Properties of Tellurium as an Isoelectronic Trap in Cadmium SulfideJournal of Applied Physics, 1968
- Investigation of the Emission of CdS Single Crystals in the 2.0 eV RegionPhysica Status Solidi (b), 1968