Effect of a metallic thin film on the propagation of Rayleigh waves
- 1 April 1973
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 44 (4), 1524-1526
- https://doi.org/10.1063/1.1662405
Abstract
An oscillator built with a thermostated Rayleigh‐wave delay line can be shifted in frequency by a metallic (Au, Cu, Al) thin film evaporated in a vacuum on the ultrasonic wave path. For very thin films (<100 Å) there is a rapid decrease in frequency of the oscillator and electrical resistance of the metal. This phenomenon is due to the short circuiting of the electric field to the interface and gives a good method for measuring the value of electromechanical coupling constant. For thicker film (from 200 to 3000 Å) the variations are much slower. The slope of the frequency‐vs thickness curve is propotional to the mass of deposited metal.Keywords
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