Effects of operating conditions on the fast-decay component of the retained polarization in lead zirconate titanate thin films
- 1 January 1994
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 75 (1), 460-466
- https://doi.org/10.1063/1.355875
Abstract
The fast‐decay component of the retained polarization in lead zirconate titanate ferroelectric capacitors was examined as a function of write/read voltage, number of cycles (fatigue), and temperature. The percentage of polarization loss within 1 s after the write pulse was found to be independent of the write/read voltage and only somewhat dependent upon the number of read/write cycles and temperature. A preliminary model is presented based on depolarizing fields within the ferroelectric due to nonswitching layers at the top and bottom interfaces.Keywords
This publication has 6 references indexed in Scilit:
- Fast decay component of the remanent polarization in thin-film PZT capacitorsIntegrated Ferroelectrics, 1992
- Quantitative measurement of space-charge effects in lead zirconate-titanate memoriesJournal of Applied Physics, 1991
- Switching kinetics of lead zirconate titanate submicron thin-film memoriesJournal of Applied Physics, 1988
- Depolarization effects in thin ferroelectric filmsFerroelectrics, 1976
- Depolarization fields in thin ferroelectric filmsJournal of Applied Physics, 1973
- Rochelle Salt as a DielectricPhysical Review B, 1930