Ge : Ga photoconductors in low infrared backgrounds
- 15 April 1979
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 34 (8), 495-497
- https://doi.org/10.1063/1.90861
Abstract
We report the development of infrared photoconductive detectors which are background fluctuation noise limited at photon fluxes ≲108 s−1. The detectors were fabricated from germanium doped with 2×1014 cm−3 gallium. Detectors operated in the conventional manner at T=3 K showed significant photoconductive response for wavelengths out to 120 μm with a minimum NEP of 2.4×10−17 W Hz−1/2 at 94 μm. Detectors operated at T=2 K with a uniaxial stress of 60 kgf mm−2 applied along a [100] direction showed significant response to 205 μm and gave a minimum NEP of 5.7×1017 W Hz−1/2 at ≈150 μm. The stressed detectors are four orders of magnitude more sensitive than any previous photoconductor beyond 120 μm.Keywords
This publication has 6 references indexed in Scilit:
- Photoionization of acceptors in uniaxially stressed germaniumSolid State Communications, 1977
- Far-infrared photoconductivity of uniaxially stressed germaniumApplied Physics Letters, 1977
- Low-noise preamplifier for photoconductive detectorsReview of Scientific Instruments, 1977
- Origin and Control of the Dominant Impurities in High-Purity GermaniumIEEE Transactions on Nuclear Science, 1976
- High-purity germanium crystal growingNuclear Instruments and Methods, 1971
- A high-detectivity gallium-doped germanium detector for the 40–120μ regionInfrared Physics, 1965