A ten-channel secundary emission monitor for electron beam analyzing purposes
- 2 May 1967
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 51 (1), 87-92
- https://doi.org/10.1016/0029-554x(67)90366-7
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Anomalous emission in secondary emission beam monitorsNuclear Instruments and Methods, 1964
- Electrometer circuit design for extended band widthsNuclear Instruments and Methods, 1964