The determination of device noise parameters
- 1 January 1969
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in Proceedings of the IEEE
- Vol. 57 (8), 1461-1462
- https://doi.org/10.1109/PROC.1969.7311
Abstract
A novel noise measurement technique is outlined which results in data that directly give the noise parameters of the test device when processed by a simple computer program.Keywords
This publication has 3 references indexed in Scilit:
- Available Power Gain, Noise Figure, and Noise Measure of Two-Ports and Their Graphical RepresentationsIEEE Transactions on Circuit Theory, 1966
- The noise performance of microwave transistorsIEEE Transactions on Electron Devices, 1966
- IRE Standards on Methods of Measuring Noise in Linear Twoports, 1959Proceedings of the IRE, 1960