Nanoscale ferroelectrics: processing, characterization and future trends
Top Cited Papers
- 25 July 2006
- journal article
- Published by IOP Publishing in Reports on Progress in Physics
- Vol. 69 (8), 2443-2474
- https://doi.org/10.1088/0034-4885/69/8/r04
Abstract
No abstract availableThis publication has 154 references indexed in Scilit:
- Significant stiffness reduction at ferroelectric domain boundary evaluated by ultrasonic atomic force microscopyApplied Physics Letters, 2005
- Domain evolution in ferroelectric thin films during fatigue processJournal of Applied Physics, 2005
- Nanoelectromechanics of polarization switching in piezoresponse force microscopyJournal of Applied Physics, 2005
- Kelvin probe force microscopy study of SrBi2Ta2O9 and PbZr0.53Ti0.47O3 thin films for high-density nonvolatile storage devicesApplied Physics Letters, 2003
- Generation of ferroelectric domains in atomic force microscopeJournal of Applied Physics, 2003
- Scanning force microscopy investigation of the Pb(Zr0.25Ti0.75)O3/Pt interfaceApplied Physics Letters, 2002
- Polarization retention in SrBi2Ta2O9 thin films investigated at nanoscaleJournal of Applied Physics, 2001
- Investigations into local piezoelectric properties by atomic force microscopyApplied Physics Letters, 2000
- Scaling effect on statistical behavior of switching parameters of ferroelectric capacitorsApplied Physics Letters, 1999
- Ultrahigh density, high-data-rate NEMS-based AFM data storage systemMicroelectronic Engineering, 1999