Reliability of Parallel Electronic Components

Abstract
Electronic components are frequently connected in parallel as a measure to increase reliability. Whether the result of such a parallel connection results in an increase or a decrease in reliability, and the amount of such increase or decrease, is a function of the open-circuit failure probability and the short-circuit failure probability. Equations are derived which permit a determination of the increase or decrease of reliability when components are connected in parallel. Some curves are included to aid the circuit designer in this determination.