OPTIMIZATION OF AUGER ELECTRON SPECTROSCOPY IN LEED SYSTEMS
- 1 September 1968
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 13 (5), 183-185
- https://doi.org/10.1063/1.1652562
Abstract
The sensitivity and resolution of Auger electron spectroscopy in a display‐type LEED system have been optimized by incorporation of a high‐current grazing incidence gun and addition of a fourth grid to the standard three‐grid system.Keywords
This publication has 2 references indexed in Scilit:
- Auger Electron Spectroscopy of fcc Metal SurfacesJournal of Applied Physics, 1968
- Use of LEED Apparatus for the Detection and Identification of Surface ContaminantsJournal of Applied Physics, 1967