The range of validity of EELS microanalysis formulae
- 31 December 1981
- journal article
- other
- Published by Elsevier in Ultramicroscopy
- Vol. 6 (1), 297-300
- https://doi.org/10.1016/s0304-3991(81)80212-4
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Quantitative microanalysis by electron energy-loss spectroscopy: Two correctionsUltramicroscopy, 1980
- K, L, and M shell generalized oscillator strengths and ionization cross sections for fast electron collisionsThe Journal of Chemical Physics, 1980
- K-shell ionization cross-sections for use in microanalysisUltramicroscopy, 1979
- Thickness determination of thin graphite and aluminium nitride foils by transmission electron microscopy using diffraction and energy loss analysisPhysica Status Solidi (a), 1978
- Formulae for light-element micro analysis by electron energy-loss spectrometryUltramicroscopy, 1978