Multilayer x-ray mirrors: Interfacial roughness, scattering, and image quality
- 1 July 1993
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 74 (1), 107-118
- https://doi.org/10.1063/1.354140
Abstract
No abstract availableKeywords
This publication has 24 references indexed in Scilit:
- Determination of roughness correlations in multilayer films for x-ray mirrorsJournal of Applied Physics, 1991
- Normal incidence soft x-ray telescopesOptical Engineering, 1991
- Sub-arcsecond observations of the solar X-ray coronaNature, 1990
- Imaging capabilities of normal-incidence x-ray telescopesOptical Engineering, 1990
- Enhancement of the reflectivity of multilayer x-ray mirrors by ion polishingOptical Engineering, 1990
- Soft X-ray Images of the Solar Corona with a Normal-Incidence Cassegrain Multilayer TelescopeScience, 1988
- Determination Of Thickness Errors And Boundary Roughness From The Measured Performance Of A Multilayer CoatingOptical Engineering, 1986
- Imaging performance of a normal incidence soft x-ray telescopeApplied Physics Letters, 1982
- Controlled fabrication of multilayer soft-x-ray mirrorsApplied Physics Letters, 1980
- X-ray diffraction study of a one-dimensional GaAs–AlAs superlatticeJournal of Applied Crystallography, 1977