Characterization of semi-insulating liquid encapsulated Czochralski GaAs by cathodoluminescence

Abstract
Characterization of semi-insulating liquid encapsulated Czochralski GaAs by cathodoluminescence in a scanning electron microscope at liquid He temperatures has revealed that the main residual impurity, carbon, is not distributed homogeneously within the material. This may lead to nonuniformities in the electrical properties of the material.