Low-temperature limit of screening length in semiconductors
- 15 May 1974
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 9 (10), 4597-4598
- https://doi.org/10.1103/physrevb.9.4597
Abstract
The conventional result for the screening length in a semiconductor with a discrete impurity level vanishes at absolute zero. When level broadening is included in a self-consistent way, a finite value is obtained. Results for the screening length and the root-mean-square potential fluctuation at absolute zero are given as functions of the degree of compensation.Keywords
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