Phase separation in amorphous Fe-Zr: Comparison of sputtered and solid-state-reacted films
- 1 April 1987
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 35 (10), 5392-5395
- https://doi.org/10.1103/physrevb.35.5392
Abstract
Amorphous FeZr films of the same average Fe and Zr concentration of 50 at.?mdash—made by cosputtering as well as by solid-state reaction of multilayers—have been compared by x-ray anomalous scattering experiments, magnetization measurements at low temperature, and transmission electron microscopy. After preparation the samples are notably different. However, annealing at temperatures between 350 and 450?deC results in the same phase separation of the amorphous state.Keywords
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