Secondary Emission from Nichrome V, CuBe, and AgMg Alloy Targets Due to Positive Ion Bombardment
- 1 July 1954
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 25 (7), 883-886
- https://doi.org/10.1063/1.1721762
Abstract
A mass spectrometer ion collector system has been devised for the investigation of secondary electron emission by impact of ions on surfaces. Results are reported for various ions incident on clean, baked (but not atomically clean) surfaces of AgMg, CuBe, and Nichrome V targets. For rare gas isotopic ions it is found that for a given energy ion the value of γ varies approximately inversely with the square root of the mass.Keywords
This publication has 6 references indexed in Scilit:
- Electron Ejection from Mo by , , andPhysical Review B, 1953
- Correction in Mass-Spectrometric Abundance Measurements in Consequence of the Mass Dependence of the Electron-Release by Means of Isotope IonsReview of Scientific Instruments, 1951
- Massenabhängigkeit der Elektronenauslösung durch isotope IonenThe European Physical Journal A, 1951
- A Simplified Emission Regulator for Mass-Spectrometer Ion SourcesReview of Scientific Instruments, 1949
- A Mass Spectrometer for Isotope and Gas AnalysisReview of Scientific Instruments, 1947
- The liberation of electrons from metal surfaces by positive ions. Part I.—ExperimentalProceedings of the Royal Society of London. Series A, Containing Papers of a Mathematical and Physical Character, 1930