Line strengths, collision strengths and excitation rates for multiply-charged silicon ions
- 30 November 1977
- journal article
- Published by Elsevier in Journal of Quantitative Spectroscopy and Radiative Transfer
- Vol. 18 (5), 535-540
- https://doi.org/10.1016/0022-4073(77)90053-x
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Electron impact excitation coefficients for laboratory and astrophysical plasmasJournal of Quantitative Spectroscopy and Radiative Transfer, 1976
- Bibliography on atomic transition probabilities/Published by National Institute of Standards and Technology (NIST) ,1966
- Ab Initio Computations in Atoms and MoleculesIBM Journal of Research and Development, 1965