Modular instrument for organic secondary ion mass spectrometry and direct chromatographic analysis
- 1 September 1986
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 57 (9), 2294-2302
- https://doi.org/10.1063/1.1138700
Abstract
A secondary ion mass spectrometer has been constructed for the analysis of organic samples introduced via a direct insertion probe and for the direct analysis of chromatographic samples. For discrete organic samples, a level of performance commensurate with commercial instruments has been established. Novel spatially resolved spectra for organic samples are presented, as well as the results of the direct sputtering of samples from a chromatographic matrix. The use of a matrix cycled through the solid/liquid phase transition for the in situ extraction of material is also described.Keywords
This publication has 17 references indexed in Scilit:
- Fast atom bombardment and laser desorption mass spectrometry for determination of alkyltriphenylphosphonium saltsAnalytical Chemistry, 1985
- Characteristics of a thin-layer chromatogram scanner-mass spectrometer systemAnalytical Chemistry, 1985
- A compilation of mass spectra from liquid metal sourcesVacuum, 1984
- Direct analysis of thin-layer chromatography spots by fast atom bombardment mass spectrometryAnalytical Chemistry, 1984
- Thin-layer chromatographic plate scanner interfaced with a mass spectrometerAnalytical Chemistry, 1983
- Positive and negative fast-atom bombardment—collision-activated dissociation—linked-field scanned mass spectra of leucine enkephalinInternational Journal of Mass Spectrometry and Ion Processes, 1983
- Secondary ion mass spectrometry with cesium ion primary beam and liquid target matrix for analysis of bioorganic compoundsAnalytical Chemistry, 1982
- Identification of quaternary alkaloids in mushroom by chromatography/secondary ion mass spectrometryAnalytical Chemistry, 1981
- High performance thin-layer chromatographyAnalytical Chemistry, 1981
- The identification of choline and its esters by secondary ion mass spectrometrySurface and Interface Analysis, 1981