Frequency dependence of photo-EMF of strongly inverted Ge and Si MIS structures—II experiments
- 31 August 1975
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 18 (7-8), 627-634
- https://doi.org/10.1016/0038-1101(75)90133-1
Abstract
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- Frequency dependence of the photo-EMF of strongly inverted Ge and Si MIS structures—I. TheorySolid-State Electronics, 1975