Triple-junction issues in field emission displays
- 1 May 2001
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
- Vol. 19 (3), 683-686
- https://doi.org/10.1116/1.1375823
Abstract
This article addresses triple-junction issues related to vacuum insulation in field emission displays (FEDs), both from a theoretical and practical point of view. A technique to inhibit the triple-junction initiated breakdown in dielectric spacer insulation has been demonstrated. In order to simulate the vacuum insulation structure in a FED, thin-film electrodes bridged by a thin-wall-structured spacer were used. Using the developed technique, the breakdown voltage was improved from ∼10 to ∼21 kV for the first run and ∼13 to 24 kV for the conditioned regime. The mechanism of breakdown of the solid insulator is discussed.Keywords
This publication has 11 references indexed in Scilit:
- Flashover performance of thin-wall spacers in field emission displaysPublished by SPIE-Intl Soc Optical Eng ,1999
- High field characteristics of thin-film metal electrodesJournal of Vacuum Science & Technology B, 1999
- FED up with fat tubesIEEE Spectrum, 1998
- HV design of vacuum componentsIEEE Transactions on Dielectrics and Electrical Insulation, 1995
- A survey of the present status of vacuum microelectronicsSolid-State Electronics, 1993
- Flashover of insulators in vacuum: review of the phenomena and techniques to improved holdoff voltageIEEE Transactions on Electrical Insulation, 1993
- Surface flashover of insulatorsIEEE Transactions on Electrical Insulation, 1989
- Novel Insulator Designs for Superior DC Hold-Off in Bridged Vacuum GapsIEEE Transactions on Electrical Insulation, 1987
- Prebreakdown Processes Associated with Surface Flashover of Solid Insulators in VacuumIEEE Transactions on Electrical Insulation, 1977
- Solid insulators in vacuum: A review (Invited paper)Vacuum, 1968