Current-voltage characteristics of the helium field-ion microscope
- 1 April 1963
- journal article
- Published by Taylor & Francis in Philosophical Magazine
- Vol. 8 (88), 579-591
- https://doi.org/10.1080/14786436308211157
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
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- Study of Atomic Structure of Metal Surfaces in the Field Ion MicroscopeJournal of Applied Physics, 1957
- Field DesorptionPhysical Review B, 1956
- Field Ionization of Gases at a Metal Surface and the Resolution of the Field Ion MicroscopePhysical Review B, 1956