Analysis of thermal transient data with synthesized dynamic models for semiconductor devices
- 1 March 1995
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part A
- Vol. 18 (1), 39-47
- https://doi.org/10.1109/95.370733
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Thermal resistance measurementsPublished by National Institute of Standards and Technology (NIST) ,1990