Dielectric Relaxation of Isoamyl Bromide

Abstract

The complex dielectric constant of isoamyl bromide has been measured at 1, 3, and 9 kMc between —75° and 25°C. Complex plane plots indicate an asymmetric, skewed‐arc distribution of relaxation times, with the shape of the distribution function not being appreciably temperature dependent. A defect diffusion model is proposed to explain the dielectric behavior of this system. This model implies that the relaxation of a molecule is more probable immediately after one of its neighbors has relaxed than at an arbitrary time. A distribution of relaxation times is derived which, under the appropriate conditions, closely resembles that of the empirical skewed‐arc function.