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Metaphase Finding Using A Fast Interval Processer, Metafip
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Metaphase Finding Using A Fast Interval Processer, Metafip
Metaphase Finding Using A Fast Interval Processer, Metafip
GS
Geoffrey Shippey
Geoffrey Shippey
RB
Royston Bayley
Royston Bayley
EG
Erik Granum
Erik Granum
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1 November 1982
proceedings article
Published by
SPIE-Intl Soc Optical Eng
Vol. 375
,
349-361
https://doi.org/10.1117/12.934664
Abstract
METAFIP is an image analysis system designed to find cells in metaphase state on a microscope slide for subsequent recall, and eventually to rank them in accordance with some quality criteria. It is based on the Fast Interval Processor (FIP), a high speed image analyser, which scans the image using a linear charge coupled diode array. Slide scan rates of tsq mm./sec. have been achieved without saturating the computer. An 8MHz stream of pixel density values is reduced to a data rate which can be digested in a fast minicomputer using interval coding. The paper describes how the interval parameters (or features) extracted by the hard-wired preprocesser are used by the metaphase finding algorithms. Results are given showing encouraging discrimination between metaphase and nonmetaphase cells on a variety of materials.© (1982) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Keywords
DIODES
IMAGE ANALYSIS
ALGORITHMS
MICROSCOPES
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Open Access
Cited by 2 articles