Microscopic metal clusters and Schottky barrier formation
- 9 February 1987
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 58 (6), 591-594
- https://doi.org/10.1103/physrevlett.58.591
Abstract
A simple interpretation is given of observed logarithmic dependence of the surface Fermi level on coverage of GaAS(110) in the range – ML in terms of the charging energy of microscopic metal clusters formed during the deposition process. New data taken on films formed at low temperature suggest that the clustering process is strongly temperature dependent.
Keywords
This publication has 13 references indexed in Scilit:
- Crystallography of In on GaAs(110): Possible Relationship of Laterally Inhomogeneous Structure to Fermi-Level PinningPhysical Review Letters, 1985
- Electron energy loss spectroscopy from GaAs(110) interfacesJournal of Vacuum Science & Technology B, 1985
- An Investigation Of The Cause Of Initial Band Bending Of A Cleaved Clean n-GaAs(llO) SurfaceMRS Proceedings, 1985
- GaAs(110)–In: The black sheep in a well-behaved interface familyJournal of Vacuum Science & Technology A, 1984
- Schottky Barrier Heights and the Continuum of Gap StatesPhysical Review Letters, 1984
- Schottky barrier formation of Ag on GaAs(110)Journal of Vacuum Science & Technology B, 1983
- Direct observation of the nucleation and growth modes of Ag/Si(111)Surface Science, 1980
- New and unified model for Schottky barrier and III–V insulator interface states formationJournal of Vacuum Science and Technology, 1979
- Ionicity and the theory of Schottky barriersPhysical Review B, 1977
- Theory of Surface StatesPhysical Review B, 1965