A rapid method for obtaining electron microscope contrast maps of various lattice defects
- 1 July 1970
- journal article
- research article
- Published by Taylor & Francis in Philosophical Magazine
- Vol. 22 (175), 175-182
- https://doi.org/10.1080/14786437008228162
Abstract
A fast and accurate matrix method is used for calculating and mapping electron microscopy contrast around lattice defects. As each contrast point is calculated separately the method can be used for defects of any geometry.Keywords
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