Effect of Flux Creep on Current-Voltage Characteristics of Superconducting Y-Ba-Cu-O Thin Films
- 1 June 1989
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 28 (6A), L991
- https://doi.org/10.1143/jjap.28.l991
Abstract
Temperature dependence of current-voltage characteristics of Y-Ba-Cu-O thin films is studied experimentally. The observed results are analyzed with the flux creep model, and good agreement is obtained between the theory and the experiment. Using the flux creep model, the pinning potential, U, is obtained as U(T=0)\gtrsim77 meV for thin films with j c(T=0)\gtrsim2×107 A/cm2. The temperature dependence of U is also obtained, and the result is discussed based on the pinning theory.Keywords
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