Quantitative analysis of weak localization in thin Mg films by magnetoresistance measurements
- 15 February 1982
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 25 (4), 2937-2939
- https://doi.org/10.1103/physrevb.25.2937
Abstract
The field dependence of the resistance of thin Mg films () is measured. The field dependence allows a quantitative analysis of the weak localization. The absolute value of the magnetoconductance agrees well with the theory. The temperature dependence of the inelastic scattering time is determined.
Keywords
This publication has 19 references indexed in Scilit:
- Electron correlations and logarithmic singularities in density of states and conductivity of disordered two-dimensional systemsJournal of Physics C: Solid State Physics, 1981
- The electronic structure of weak, random, two- and three-dimensional potentialsPhilosophical Magazine Part B, 1981
- The observation of interaction and localisation effects in a two-dimensional electron gas at low temperaturesJournal of Physics C: Solid State Physics, 1980
- lnTDependence of Resistivity in Two-Dimensionally Coupled Fine Particles of CuJournal of the Physics Society Japan, 1980
- Anderson Localization inDimensions: A Self-Consistent Diagrammatic TheoryPhysical Review Letters, 1980
- Interaction Effects in Disordered Fermi Systems in Two DimensionsPhysical Review Letters, 1980
- Scaling studies of localizationJournal of Non-Crystalline Solids, 1980
- Possible Explanation of Nonlinear Conductivity in Thin-Film Metal WiresPhysical Review Letters, 1979
- Nonmetallic Conduction in Thin Metal Films at Low TemperaturesPhysical Review Letters, 1979
- Scaling Theory of Localization: Absence of Quantum Diffusion in Two DimensionsPhysical Review Letters, 1979