Spatial resolution in x-ray microanalysis of thin foils in stem
- 31 December 1978
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 3, 401-405
- https://doi.org/10.1016/s0304-3991(78)80062-x
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Microanalysis of Grain Boundary Segregation in Embrittled Iron‐3wt% Nickel Alloys Using STEMJournal of Microscopy, 1978
- Improved spatial resolution microanalysis in a scanning transmission electron microscopeX-Ray Spectrometry, 1977
- On the production of X-rays in thin metal foilsPhilosophical Magazine, 1962