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A Large Scale Reliability Study of Burnout Failure in GaAs Power FETs
Home
Publications
A Large Scale Reliability Study of Burnout Failure in GaAs Power FETs
A Large Scale Reliability Study of Burnout Failure in GaAs Power FETs
AJ
A. S. Jordan
A. S. Jordan
JI
J. C. Irvin
J. C. Irvin
WS
W. O. Schlosser
W. O. Schlosser
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1 April 1980
proceedings article
Published by
Institute of Electrical and Electronics Engineers (IEEE)
in
8th Reliability Physics Symposium
https://doi.org/10.1109/irps.1980.362928
Abstract
No abstract available
Cited by 2 articles