High-resolution photoemission studies at rough Cu(111) surfaces: The influence of defect scattering and disorder-dependent dephasing processes
- 11 January 1999
- journal article
- Published by Elsevier in Surface Science
- Vol. 420 (1), 33-42
- https://doi.org/10.1016/s0039-6028(98)00811-5
Abstract
No abstract availableKeywords
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