Depth profile determination by ion-induced X-ray spectroscopy
- 15 September 1974
- journal article
- other
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 120 (3), 543-545
- https://doi.org/10.1016/0029-554x(74)90028-7
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Full-range solution for the measurement of thin-film surface densities with proton-excited x raysJournal of Applied Physics, 1972
- Range and stopping-power tables for heavy ionsAtomic Data and Nuclear Data Tables, 1970
- A Technique for the Numerical Solution of Certain Integral Equations of the First KindJournal of the ACM, 1962