Abstract
The surface photoelectric yield of indium has been obtained by measuring in situ the total yield and the reflectivity for s and p polarizations on ultrasmooth evaporated films with preferential (111) orientation. With use of a theoretical calculation of Feibelman, it is shown that it is possible to extract the surface potential from the data in the energy range 0.6<ωωp<1. It deviates strongly from the corresponding Lang-Kohn result.
Keywords