Quantitative X-ray photoelectron diffraction studies of single-crystal silicates
- 31 March 1980
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 33 (12), 1213-1215
- https://doi.org/10.1016/0038-1098(80)90793-0
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Angular variations in core-level XPS peak intensity ratios from single-crystal solidsSurface Science, 1979
- The surface structure and composition of layered silicate minerals: novel insights from X-ray photoelectron diffraction, K-emission spectroscopy and cognate techniquesPhilosophical Transactions of the Royal Society of London. Series A, Mathematical and Physical Sciences, 1979
- X-ray photoelectron diffraction: a new technique for structural studies of complex solidsJournal of the American Chemical Society, 1978