The Critical Voltage Effect in Transmission Electron Microscopy. I. Eigenvalue Degeneracy in the Three-Beam Case
- 1 December 1974
- journal article
- research article
- Published by Wiley in Physica Status Solidi (b)
- Vol. 66 (2), 471-482
- https://doi.org/10.1002/pssb.2220660209
Abstract
No abstract availableKeywords
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- The application of non-systematic many-beam dynamic effects to structure factor determinationActa Crystallographica Section A, 1971
- A Particular Many Beam Situation in Transmission Electron DiffractionPhysica Status Solidi (b), 1971
- Consequences of Bloch's Theorem on the Dynamical Theory of Electron Diffraction ContrastPhysica Status Solidi (b), 1969
- 222 Electron Reflection from Aluminium and Systematic InteractionJapanese Journal of Applied Physics, 1967