Characteristic Modified X-Ray Scattering

Abstract

The spectroscopic analysis of the scattered x rays from lithium, lithium oxide, lithium fluoride, beryllium, and boron irradiated by copper target radiation establishes the existence of sharp characteristic modified lines on the longer wavelength side of the primary beam. This is a new type of incoherent x-ray scattering. The $K$ term values of lithium, beryllium, and boron and the $L_1$ term value of fluorine in lithium fluoride have been calculated from the observed modified lines and these are 58.1, 113.6, 199.0, and 40.6 eV, respectively. Taking into account the limits of error in these experiments, the term values obtained by this new method agree well with the values obtained by Skinner by the method of soft x-ray spectroscopy. Evidence obtained until now about the angular dependence of intensity of the newly observed modified lines brings up several interesting points helping to understand the particular process of scattering, and these points have been discussed.