High-Sensitivity ESCA Instrument

Publisher Website

1 January 1973

book chapter
Published by Springer Nature

p. 90-101
https://doi.org/10.1007/978-1-4613-9972-8_9

Abstract

No abstract available

This publication has 2 references indexed in Scilit:

A Total reflection X-Ray Spectrograph for Fluorescent Analysis of Light Elements
Advances in X-ray Analysis, 1968
Effects of Chemical State and of Mechanical Deformation on the Wave-length of X-ray Emission Lines
Nature, 1965

Cited by 5 articles