Imaging micropatterned organosilane self‐assembled monolayers on silicon by means of scanning electron microscopy and Kelvin probe force microscopy
- 14 January 2003
- journal article
- conference paper
- Published by Wiley in Surface and Interface Analysis
- Vol. 35 (1), 94-98
- https://doi.org/10.1002/sia.1501
Abstract
No abstract availableKeywords
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