Angle-resolved photoelectron-spectroscopy study of the Si(001)2×1-K surface
- 15 December 1987
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 36 (18), 9801-9804
- https://doi.org/10.1103/physrevb.36.9801
Abstract
Angle-resolved ultraviolet photoelectron spectra for the Si(001)2×1-K surface have been measured as a function of K coverage. It is found that the Si(001)2×1-K surface is semiconducting at saturation K coverage, in contrast to previous interpretations of electron-energy-loss spectra based on a metallic Si(001)2×1-K surface. It is further inferred that the saturation coverage of K for the Si(001)2×1-K surface is one monolayer instead of half a monolayer as generally assumed for alkali-metal/Si(001) surfaces.Keywords
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