Optical and Electron Microscope Examination of Preselected Areas
- 1 November 1957
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 28 (11), 960-961
- https://doi.org/10.1063/1.1715775
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- A simple adaptation of the carbon replica technique for the examination of selected areas in the electron microscopeBritish Journal of Applied Physics, 1955