Energy dispersive x-ray diffraction of micro-crystals at ultrahigh pressures

Abstract

Ultrahigh pressures and temperatures in diamond-anvil cells are achieved at the expense of reducing sample volume. The capability of x-ray diffraction with high spatial resolution is most fundamental for probing microscopic samples at the maximum P-T and for minimizing the effect of gradients. Polychromatic synchrotron radiation with energy dispersive x-ray diffraction is ideal for the development of new classes of structural microprobes. Primary x-ray beams down to 3 microns can be produced with microbeam slit systems and microfocusing optical devices. The microprobe can be routinely used for a variety of high-pressure experiments, including single-crystal x-ray diffraction above 50 GPa, polycrystal-line diffraction above 300 GPa, deviatoric strain measurements, and diffraction at simultaneous high pressure and temperature.